Product Description

• Offers <0.08 micron particle sensitivity on polished silicon wafers
• Exceptional sensitivity to microscratches for automatic wafer surface inspection, defect detection and classification on 2" - 12" transparent and opaque wafers.
• Dual-laser Optical X-Beam technology is well-suited for both laboratory and low volume production applications.

The Candela CS10 Optical Surface Analyzer offers a new approach to unpatterned wafer surface inspection. By combining two laser paths and four independent wafer surface detection techniques, the CS10 Optical Surface Analyzer offers exceptional sensitivity to particles and scratches on optoelectronics and semiconductor wafers.

Using a fast spiral scan motion, the CS10 Optical Surface Analyzer simultaneously measures phase shift, scattered light, reflected light, and topography. The CS10 Optical Surface Analyzer  provides data that is represented as high resolution image maps to facilitate visual inspection, or automatically analyzed to detect and classify wafer surface defects.

The compact CS10 Optical Surface Analyzer platform is well-suited for both laboratory and low volume production applications. This optical surface analyzer is easy to learn and operate. This optical surface analyzer is the ideal wafer inspection system for failure analysis and process development applications.

For more information on the CS10 Optical Surface Analyzer contact our authorized sales representatives in the United States, Asia or Europe. For inquiries, please contact our Sales, Service, or Applications teams.

Contact Me >

Gallium Arsenide Epi Defects
Gallium Arsenide Wafer Inspection
Inspection of Transparent Substrates
Silicon Carbide Defects